org setting to enable void-overdues-on-mark-item-damaged

git-svn-id: svn://svn.open-ils.org/ILS/trunk@14555 dcc99617-32d9-48b4-a31d-7c20da2025e4

diff --git a/Open-ILS/src/sql/Pg/002.schema.config.sql b/Open-ILS/src/sql/Pg/002.schema.config.sql
index ab9679c..a89398c 100644 (file)
--- a/Open-ILS/src/sql/Pg/002.schema.config.sql
+++ b/Open-ILS/src/sql/Pg/002.schema.config.sql
@@ -51,7 +51,7 @@ CREATE TABLE config.upgrade_log (
     install_date    TIMESTAMP WITH TIME ZONE NOT NULL DEFAULT NOW()
 );
 
-INSERT INTO config.upgrade_log (version) VALUES ('0047'); -- berick
+INSERT INTO config.upgrade_log (version) VALUES ('0048'); -- berick
 
 
 CREATE TABLE config.bib_source (

diff --git a/Open-ILS/src/sql/Pg/950.data.seed-values.sql b/Open-ILS/src/sql/Pg/950.data.seed-values.sql
index ea51a24..187cdff 100644 (file)
--- a/Open-ILS/src/sql/Pg/950.data.seed-values.sql
+++ b/Open-ILS/src/sql/Pg/950.data.seed-values.sql
@@ -2276,3 +2276,13 @@ INSERT INTO
         'bool'
     );
 
+-- mark damaged void overdue setting
+INSERT INTO
+    config.org_unit_setting_type ( name, label, description, datatype )
+    VALUES (
+        'circ.damaged.void_ovedue',
+        'Mark item damaged voids overdues',
+        'When an item is marked damaged, overdue fines on the most recent circulation are voided.',
+        'bool'
+    );
+

diff --git a/Open-ILS/src/sql/Pg/upgrade/0048.data.org-setting-damaged-void-overdue.sql b/Open-ILS/src/sql/Pg/upgrade/0048.data.org-setting-damaged-void-overdue.sql
new file mode 100644 (file)
index 0000000..f02adbd
--- /dev/null
+++ b/Open-ILS/src/sql/Pg/upgrade/0048.data.org-setting-damaged-void-overdue.sql
@@ -0,0 +1,14 @@
+BEGIN;
+
+INSERT INTO config.upgrade_log (version) VALUES ('0048');
+
+INSERT INTO
+    config.org_unit_setting_type ( name, label, description, datatype )
+    VALUES (
+        'circ.damaged.void_ovedue',
+        'Mark item damaged voids overdues',
+        'When an item is marked damaged, overdue fines on the most recent circulation are voided.',
+        'bool'
+    );
+
+COMMIT;